High-Quality Parallel Depth-of-Field Using Line Samples

dc.contributor.authorTzeng, Stanleyen_US
dc.contributor.authorPatney, Anjulen_US
dc.contributor.authorDavidson, Andrewen_US
dc.contributor.authorEbeida, Mohamed S.en_US
dc.contributor.authorMitchell, Scott A.en_US
dc.contributor.authorOwens, John D.en_US
dc.contributor.editorCarsten Dachsbacher and Jacob Munkberg and Jacopo Pantaleonien_US
dc.date.accessioned2013-10-28T10:23:55Z
dc.date.available2013-10-28T10:23:55Z
dc.date.issued2012en_US
dc.description.abstractWe present a parallel method for rendering high-quality depth-of-field effects using continuous-domain line samples, and demonstrate its high performance on commodity GPUs. Our method runs at interactive rates and has very low noise. Our exploration of the problem carefully considers implementation alternatives, and transforms an originally unbounded storage requirement to a small fixed requirement using heuristics to maintain quality. We also propose a novel blur-dependent level-of-detail scheme that helps accelerate rendering without undesirable artifacts. Our method consistently runs 4 to 5x faster than an equivalent point sampler with better image quality. Our method draws parallels to related work in rendering multi-fragment effects.en_US
dc.description.seriesinformationEurographics/ ACM SIGGRAPH Symposium on High Performance Graphicsen_US
dc.identifier.isbn978-3-905674-41-5en_US
dc.identifier.issn2079-8679en_US
dc.identifier.urihttp://dx.doi.org/10.2312/EGGH/HPG12/023-031en_US
dc.publisherThe Eurographics Associationen_US
dc.titleHigh-Quality Parallel Depth-of-Field Using Line Samplesen_US
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