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    • Efficient Basis Decomposition for Scattered Reflectance Data 

      Weistroffer, R. Peter; Walcott, Kristen R.; Humphreys, Greg; Lawrence, Jason (The Eurographics Association, 2007)
      Recent progress in acquisition technology has increased the availability and quality of measured appearance data. Although representations based on dimensionality reduction provide the greatest fidelity to measured data, ...