Multi-scale Feature Extraction on Point-Sampled Surfaces

dc.contributor.authorPauly, Marken_US
dc.contributor.authorKeiser, Richarden_US
dc.contributor.authorGross, Markusen_US
dc.date.accessioned2015-02-16T08:00:52Z
dc.date.available2015-02-16T08:00:52Z
dc.date.issued2003en_US
dc.description.abstractWe present a new technique for extracting line-type features on point-sampled geometry. Given an unstructuredpoint cloud as input, our method first applies principal component analysis on local neighborhoods toclassify points according to the likelihood that they belong to a feature. Using hysteresis thresholding, we thencompute a minimum spanning graph as an initial approximation of the feature lines. To smooth out the featureswhile maintaining a close connection to the underlying surface, we use an adaptation of active contour models.Central to our method is a multi-scale classification operator that allows feature analysis at multiplescales, using the size of the local neighborhoods as a discrete scale parameter. This significantly improves thereliability of the detection phase and makes our method more robust in the presence of noise. To illustrate theusefulness of our method, we have implemented a non-photorealistic point renderer to visualize point-sampledsurfaces as line drawings of their extracted feature curves.en_US
dc.description.number3en_US
dc.description.seriesinformationComputer Graphics Forumen_US
dc.description.volume22en_US
dc.identifier.doi10.1111/1467-8659.00675en_US
dc.identifier.issn1467-8659en_US
dc.identifier.pages281-289en_US
dc.identifier.urihttps://doi.org/10.1111/1467-8659.00675en_US
dc.publisherBlackwell Publishers, Inc and the Eurographics Associationen_US
dc.titleMulti-scale Feature Extraction on Point-Sampled Surfacesen_US
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