Accurate Fitting of Measured Reflectances Using a Shifted Gamma Micro-facet Distribution

dc.contributor.authorBagher, Mohammad Mahdien_US
dc.contributor.authorSoler, Cyrilen_US
dc.contributor.authorHolzschuch, Nicolasen_US
dc.contributor.editorFredo Durand and Diego Gutierrezen_US
dc.description.abstractMaterial models are essential to the production of photo-realistic images. Measured BRDFs provide accurate representation with complex visual appearance, but have larger storage cost. Analytical BRDFs such as Cook- Torrance provide a compact representation but fail to represent the effects we observe with measured appearance. Accurately fitting an analytical BRDF to measured data remains a challenging problem. In this paper we introduce the SGD micro-facet distribution for Cook-Torrance BRDF. This distribution accurately models the behavior of most materials. As a consequence, we accurately represent all measured BRDFs using a single lobe. Our fitting procedure is stable and robust, and does not require manual tweaking of the parameters.en_US
dc.description.seriesinformationComputer Graphics Forumen_US
dc.publisherThe Eurographics Association and Blackwell Publishing Ltd.en_US
dc.subjectI.3.7 [Computer Graphics]en_US
dc.subjectThree Dimensional Graphics and Realismen_US
dc.subjectand textureen_US
dc.titleAccurate Fitting of Measured Reflectances Using a Shifted Gamma Micro-facet Distributionen_US