Signal-Specialized Parameterization for Piecewise Linear Reconstruction

Tewari, Geetika; Snyder, John; Sander, Pedro V.; Gortler, Steven J.; Hoppe, Hugues

Signal-Specialized Parameterization for Piecewise Linear Reconstruction

Files

057-066.pdf (3.3 MB)

Date

2004

Authors

Tewari, Geetika
Snyder, John
Sander, Pedro V.
Gortler, Steven J.
Hoppe, Hugues

Publisher

The Eurographics Association

Abstract

We propose a metric for surface parameterization specialized to its signal that can be used to create more efficient, high-quality texture maps. Derived from Taylor expansion of signal error, our metric predicts the signal approximation error - the difference between the original surface signal and its reconstruction from the sampled texture. Unlike previous methods, our metric assumes piecewise-linear reconstruction, and thus makes a good approximation to bilinear reconstruction employed in graphics hardware. We achieve significant savings in texture area for a desired signal accuracy compared to the signal-specialized parameterization metric proposed by Sander et al. in the 2002 Eurographics Workshop on Rendering.

        @inproceedings{:10.2312/SGP/SGP04/057-066
,
booktitle = {Symposium on Geometry Processing
},
editor = {Roberto Scopigno and Denis Zorin
},
title = {{Signal-Specialized Parameterization for Piecewise Linear Reconstruction
}},
author = {Tewari, Geetika and 
Snyder, John and 
Sander, Pedro V. and 
Gortler, Steven J. and 
Hoppe, Hugues
},
year = {2004
},
publisher = {The Eurographics Association
},
ISSN = {1727-8384
},
ISBN = {3-905673-13-4
},
DOI = {/10.2312/SGP/SGP04/057-066
}
}