Nogue, EmilieLin, YimingGhosh, AbhijeetGhosh, AbhijeetWei, Li-Yi2022-07-012022-07-012022978-3-03868-187-81727-3463https://doi.org/10.2312/sr.20221154https://diglib.eg.org:443/handle/10.2312/sr20221154We present a practical method for measurement of spatially varying isotropic surface reflectance of planar samples using a combination of single-view polarization imaging and near-field display illumination. Unlike previous works that have required multiview imaging or more complex polarization measurements, our method requires only three linear polarizer measurements from a single viewpoint for estimating diffuse and specular albedo and spatially varying specular roughness. We obtain highquality estimate of the surface normal with two additional polarized measurements under a gradient illumination pattern. Our approach enables high-quality renderings of planar surfaces while reducing measurements to a near-optimal number for the estimated SVBRDF parameters.Attribution 4.0 International LicenseCCS Concepts: Computing methodologies --> Rendering; Image and video acquisitionComputing methodologiesRenderingImage and video acquisition10.2312/sr.2022115439-479 pages