Adams, BartKeiser, RichardPauly, MarkJ. Guibas, LeonidasGross, MarkusDutre, Philip2015-02-202015-02-2020051467-8659https://doi.org/10.1111/j.1467-8659.2005.00892.xEfficient Raytracing of Deforming Point-Sampled Surfaces10.1111/j.1467-8659.2005.00892.x677-684