Show simple item record

dc.contributor.authorLensch, Hendrik P.A.en_US
dc.contributor.authorLang, Jochenen_US
dc.contributor.authorSa, Asla M.en_US
dc.contributor.authorSeidel, Hans-Peteren_US
dc.date.accessioned2015-02-16T08:01:13Z
dc.date.available2015-02-16T08:01:13Z
dc.date.issued2003en_US
dc.identifier.issn1467-8659en_US
dc.identifier.urihttp://dx.doi.org/10.1111/1467-8659.00695en_US
dc.description.abstractMeasuring reflection properties of a 3D object involves capturing images for numerous viewing and lightingdirections. We present a method to select advantageous measurement directions based on analyzing the estimationof the bi-directional reflectance distribution function (BRDF). The selected directions minimize the uncertaintyin the estimated parameters of the BRDF. As a result, few measurements suffice to produce models that describethe reflectance behavior well. Moreover, the uncertainty measure can be computed fast on modern graphics cardsby exploiting their capability to render into a floating-point frame buffer. This forms the basis of an acquisitionplanner capable of guiding experts and non-experts alike through the BRDF acquisition process. We demonstratethat spatially varying reflection properties can be captured more efficiently for real-world applications using ouracquisition planner.Categories and Subject Descriptors (according to ACM CCS): I.3.7 [Computer Graphics]: Three-DimensionalGraphics and Realism Virtual Reality I.4.1 [Computer Vision]: Digitization and Image Capture, Reflectanceen_US
dc.publisherBlackwell Publishers, Inc and the Eurographics Associationen_US
dc.titlePlanned Sampling of Spatially Varying BRDFsen_US
dc.description.seriesinformationComputer Graphics Forumen_US
dc.description.volume22en_US
dc.description.number3en_US
dc.identifier.doi10.1111/1467-8659.00695en_US
dc.identifier.pages473-482en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record