Browsing VMV14 by Subject "Enhancement"
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Non-local Means for Scanning Transmission Electron Microscopy Images and Poisson Noise based on Adaptive Periodic Similarity Search and Patch Regularization
(The Eurographics Association, 2014)High-Angle Annular Darkfield Scanning Transmission Electron Microscopy (HAADF-STEM) allows to take images at atomic scale with a contrast proportional to the atomic number. STEM acquires an image line-by-line, pixel-by-pixel ...