Tsai, Karen C.; Bujack, Roxana; Geveci, Berk; Ayachit, Utkarsh; Ahrens, James (The Eurographics Association, 2020)
Feature-driven in situ data reduction can overcome the I/O bottleneck that large simulations face in modern supercomputer architectures in a semantically meaningful way. In this work, we make use of pattern detection as a ...