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dc.contributor.authorWang, C. C. L.en_US
dc.contributor.authorTang, K.en_US
dc.contributor.editorGershon Elber and Nicholas Patrikalakis and Pere Bruneten_US
dc.date.accessioned2016-02-17T18:02:46Z
dc.date.available2016-02-17T18:02:46Z
dc.date.issued2004en_US
dc.identifier.isbn3-905673-55-Xen_US
dc.identifier.issn1811-7783en_US
dc.identifier.urihttp://dx.doi.org/10.2312/sm.20041394en_US
dc.description.abstractA novel and practical approach is presented in this paper that solves a constrained free-form deformation (FFD) problem where the developability of the tessellated embedded surface patches is preserved during the lattice deformation. The formulated constrained FFD problem has direct application in areas of product design where the surface developability is required, such as clothing, ship hulls, automobile parts, etc. In the proposed approach, the developability-preserved FFD problem is formulated as a constrained optimization problem. Different from other contained FFD approaches, the positions of lattice control points are not modified in our algorithm - as their control is insufficient in regards to the developability of all the nodes in the mesh. Moreover, the optimization is performed on the parameters of the mesh nodes rather than directly modifying their 3D coordinates, which avoids the time-consuming inverse calculation of the parameters of every node in a non-parallelepiped control lattice when further deformations are required.en_US
dc.publisherThe Eurographics Associationen_US
dc.subjectI.3.5 [Computational Geometry and Object Modeling]en_US
dc.subjectCurveen_US
dc.subjectSurfaceen_US
dc.subjectsolid and object representationen_US
dc.subjectModeling packages.en_US
dc.subjectJ.6 [Computeren_US
dc.subjectAided Engineering]en_US
dc.subjectComputeren_US
dc.subjectAided Design (CAD)en_US
dc.titleDevelopability-preserved Free-form Deformation of Assembled Patchesen_US
dc.description.seriesinformationSolid Modelingen_US
dc.description.sectionheadersPosters Sessionen_US
dc.identifier.doi10.2312/sm.20041394en_US
dc.identifier.pages231-236en_US


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