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dc.contributor.authorShirmun, Leon A.en_US
dc.contributor.authorAbi-Ezzi, Salim S.en_US
dc.date.accessioned2014-10-21T07:25:38Z
dc.date.available2014-10-21T07:25:38Z
dc.date.issued1993en_US
dc.identifier.issn1467-8659en_US
dc.identifier.urihttp://dx.doi.org/10.1111/1467-8659.1230261en_US
dc.description.abstractThe cone of normals technique for curved surface patches allows to perform various quick tests at the patch level such as front- or backfacing test, light influence test, and existence of silhouette edges test. For a given patch, a truncated cone of normals is constructed at creation time, which contains all points and all normal directions of the patch. At traversal time, a simple scalar product test determines whether the whole patch is backfacing or frontfacing, so that the costly step of tessellating the patch is avoided in case of patch level face culling. In addition, the technique quickly determines which light sources have no influence on a patch, and which patches have no silhouette edges. The technique can also be used for other surface primitives, such as triangular strips and quadrilateral meshes,en_US
dc.publisherBlackwell Science Ltd and the Eurographics Associationen_US
dc.titleThe Cone of Normals Technique for Fast Processing of Curved Patchesen_US
dc.description.seriesinformationComputer Graphics Forumen_US
dc.description.volume12en_US
dc.description.number3en_US
dc.identifier.doi10.1111/1467-8659.1230261en_US
dc.identifier.pages261-272en_US


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