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Computer Graphics Forum
Volume22, Issue 3 (September 2003)
Authors:
Hendrik P.A. Lensch
1MPI Informatik, Saarbrücken, Germany
Jochen Lang
1MPI Informatik, Saarbrücken, Germany
Asla M. Sá
2Instituto Nacional de Matemática Pura e Aplicada - IMPA, Brazil
Hans-Peter Seidel
1MPI Informatik, Saarbrücken, Germany
Summary:
Measuring reflection properties of a 3D object involves capturing images for numerous viewing and lightingdirections. We present a method to select advantageous measurement directions based on analyzing the estimationof the bi-directional reflectance distribution function (BRDF). The selected directions minimize the uncertaintyin the estimated parameters of the BRDF. As a result, few measurements suffice to produce models that describethe reflectance behavior well. Moreover, the uncertainty measure can be computed fast on modern graphics cardsby exploiting their capability to render into a floating-point frame buffer. This forms the basis of an acquisitionplanner capable of guiding experts and non-experts alike through the BRDF acquisition process. We demonstratethat spatially varying reflection properties can be captured more efficiently for real-world applications using ouracquisition planner.
Categories and Subject Descriptors (according to ACM CCS): I.3.7 [Computer Graphics]: Three-DimensionalGraphics and Realism Virtual Reality I.4.1 [Computer Vision]: Digitization and Image Capture, Reflectance